-------------------------------------------------------------------- COLLOQUIUM OF THE COMPUTATIONAL MATERIALS SCIENCE CENTER College of Science (CDS Department CSI 898-Sec 001) -------------------------------------------------------------------- Rough surface adhesion in dry and wet environments Frank del Rio Materials Science and Engineering Laboratory National Institute of Standards and Technology, Gaithersburg, MD Microelectromechanical systems (MEMS) are currently used in industrial applications such as accelerometers, gyroscopes, pressure sensors, and digital micromirror devices as a result of inherent performance enhancements and manufacturing cost reductions. One of the major hurdles preventing a larger number of MEMS-based products from entering the mainstream is unwanted adhesion, commonly called stiction, which prevents relative motion between structures. MEMS are particularly vulnerable to adhesion as a result of the large surface-to-volume ratio, small surface separations, and highly compliant components. The purpose of this work is to understand the role of the various interfacial forces via microcantilever experiments as a function of surface roughness and relative humidity (RH) and independent calculations using the measured surface topography. In dry ambients, van der Waals dispersion forces are the dominant adhesion mechanism. While the average surface separation Dave is governed by the contacting (highest) summits, the adhesion is mainly due to van der Waals dispersion forces acting across extensive non-contacting areas and is related to 1/Dave2. In wet ambients, capillary condensation of water has a significant effect on rough surface adhesion. Above a threshold RH, which is a function of the surface roughness, the adhesion jumps due to meniscus formation at the interface and increases rapidly towards the upper limit of 144 mJ/m2. A detailed model based on the measured surface topography qualitatively agrees with the experimental data only when the topographic correlations between the upper and lower surfaces are considered. In addition to van der Waals and capillary attractions, particulates can also strongly influence the interfacial adhesion between rough surfaces by changing their average separation. Above a threshold density, the particles introduce a topography that is more significant than the intrinsic surface roughness. As a result, the interfacial separation is governed by the particle size and the adhesion is lower but stochastic in nature. Based on the composition and mechanical properties, we determined that the particles on our micromachined surfaces are silicon carbide (SiC). High temperature annealing in the fabrication process allows residual carbon in the sacrificial oxide layer to migrate to the polysilicon surface and form the SiC particles. Monday, February 2, 2009 4:30 pm Room 301, Research I, Fairfax Campus Refreshments will be served at 4:15 PM. ---------------------------------------------------------------------- Find the schedule at www.cmasc.gmu.edu/seminar/schedule.html --------------------------------------------------------------------